[OPTICAL REVIEW Vol. 1, No. 1 (1994) 36-38]

Linear Phase Shift Response With High Dynamic Range for Holographic Recording in As2S3

Christoph H. DIETRICH,1 Steffen NOEHTE,1 Reinhard MANNER1 and Kurt K. SCHWARTZ2

1Chair of computer Science V, University of Mannheim, Mannheim, Germany, 2Physical Institute, University of Heidelberg, Heidelberg, Germany

(Accepted August 4, 1994)

Amorphous As2S3 films are real-time photographic materials for phase holograms. This work focuses on the phase shift in As2S3 films as a function of the exposure. A method for measuring the phase shift response and the exposure simultaneously is presented. A relative displacement determination of interferometric patterns allows precise measurements insensitive to changes of experimental conditions. The phase shift dependence on the intensity of the writing beam is evaluated for two different films. As a result, a linear phase shift response is obtained with a dynamic range of nearly EE. It is independent of the intensity over four orders of magnitude. The results are proofed by diffraction efficiency measurements.

Key words : interferometric phase shift measuring, holographic recording materials, Iinear phase recording, As2S3