[OPTICAL REVIEW Vol. 3, No. 4 (1996) 227-231]
Numerical Method to Fit the Refractive Index Profile of Planar Microlenses Made by Ion Exchange Techniques
Eva ACOSTA1, Susana RÍOS1, Masahiro OIKAWA2, Akimitsu SATO3 and Kenichi IGA4
1Laboratorio de Óptica, Departmento de Física Aplicada, Facultad de Física Universidad de Santiago de Compostela, E-15706 Santiago de Compostela, Galicia, Spain 2Nippon Sheet Glass Co., Ltd., Sumimoto Fudosan Shiba Bldg., 11-11, 1-Chome, Shiba, Minato-ku, Tokyo 105, Japan 3Nippon Sheet Glass Co., Ltd., Fiber Optics Division, Tsukuba Research Center, 5-4, Tokodai Tsukuba-rity, Ibaraki 300-26, Japan 4Tokyo Institute of Technology, 4259, Nagatsuta, Midori-ku, Yokohama 227, Japan
(Received August 30, 1995; Accepted April 30, 1996)
We present a fitting method for obtaining a functional form of the refractive index profile of planar microlenses made by ion exchange techniques from total shearing interferometric measurements. Compared to the usual power series expansion fit, this method allows a reduction in the number of coefficients needed to characterize a lens.
Key words : planar microlenses, 3-D distributed index profile, shearing interferometry, ion exchange techniques