Takeaki YOSHIMURA, Naoki MASAZUMI and Yuichi SHIGEMATSU

Department of Computer and Systems Engineering, Faculty of Engineering, Kobe University Rokko, Nada, Kobe, 657 Japan

(Received September 2, 1996; Accepted December 6, 1996)

A new imaging system based on optical frequency domain reflectometry is presented. The intensity-integration effect of the charge coupled device camera to be used acts effectively as a low pass filter for the intensity fluctuation and the 2nd order moment of the detected signals is proportional to a low beat frequency component of the interference signal. Consequently, two-dimensionally imaging of the reflectance of a selective plane located in scattering media is demonstrated.

Key words : reflectivity imaging, scattering medium, optical frequency domain reflectometry, 2nd order moment