[OPTICAL REVIEW Vol. 4, No. 1B (1997) 221-227]
Imaging a Reflecting Plate Located in Scattering Media Using Optical Frequency Domain Reflectometry
Takeaki YOSHIMURA, Naoki MASAZUMI and Yuichi SHIGEMATSU
Department of Computer and Systems Engineering, Faculty of Engineering, Kobe University Rokko, Nada, Kobe, 657 Japan
(Received September 2, 1996; Accepted December 6, 1996)
A new imaging system based on optical frequency domain reflectometry is presented. The intensity-integration effect of the charge coupled device camera to be used acts effectively as a low pass filter for the intensity fluctuation and the 2nd order moment of the detected signals is proportional to a low beat frequency component of the interference signal. Consequently, two-dimensionally imaging of the reflectance of a selective plane located in scattering media is demonstrated.
Key words : reflectivity imaging, scattering medium, optical frequency domain reflectometry, 2nd order moment