[OPTICAL REVIEW Vol. 4, No. 3 (1997) 429-432]

Automatic Deformation Analysis in Electronic Speckle Pattern Interferometry Using One Speckle Interferogram of Deformed Object

Masaaki ADACHI,* Yukio UEYAMA and Katsuyuki INABE

Faculty of Engineering, Kanazawa University, 2-40-20, Kodatsuno, Kanazawa, 920 Japan

(Received February 1, 1996; Accepted February 14, 1997)

We propose a new fringe analysis method that uses only one speckle interferogram of a deformed object to obtain phase change distribution by deformation. This method uses cos-1 operations to extract absolute, not signed, values of new phase after deformation. Considering the phase changes in a small local area, true phase changes retain almost the same value by assuming a continuous deformation in the area. This retention determines the sign of the new phase. From the new phase and the initial phase, the phase change distribution by the deformation can be obtained. Experimental results show the usefulness of this method.

Key words : electronic speckle pattern interferometry, deformation, arccosine operation, phase change distribution, automatic analysis