[OPTICAL REVIEW Vol. 4, No. 5 (1997) 601-604]
Two Beam Collection Mode Photon Scanning Tunneling Microscope
Tetsuya KAWANISHI,1 Kouichiro TAMADA and Masao KITANO2
Department of Electronics and Communication, Kyoto University, Yoshidahonmachi, Sakyoku, Kyoto, 606-01 Japan
(Received June 16, 1997; Accepted July 18, 1997)
We studied the image deformation due to the surface inclination of objects in photon scanning tunneling microscopes (PSTM). A novel collection mode PSTM with two light sources is proposed to reduce the deformation and experimental results show that the PSTM system is effective.
Key words : photon scanning tunneling microscope, evanescent wave, inclination of surface, deformation of image, near field