[OPTICAL REVIEW Vol. 4, No. 5 (1997) 601-604]

Two Beam Collection Mode Photon Scanning Tunneling Microscope

Tetsuya KAWANISHI,1 Kouichiro TAMADA and Masao KITANO2

Department of Electronics and Communication, Kyoto University, Yoshidahonmachi, Sakyoku, Kyoto, 606-01 Japan

(Received June 16, 1997; Accepted July 18, 1997)

We studied the image deformation due to the surface inclination of objects in photon scanning tunneling microscopes (PSTM). A novel collection mode PSTM with two light sources is proposed to reduce the deformation and experimental results show that the PSTM system is effective.

Key words : photon scanning tunneling microscope, evanescent wave, inclination of surface, deformation of image, near field

1. kawanish@kuee.kyoto-u.ac.jp 2. kitano@kuee.kyoto-u.ac.jp