[OPTICAL REVIEW Vol. 5, No. 1 (1998) 21-26]

White-Light Frequency-Domain Interferometry Using a Kösters Prism

Yoshihiro OHTSUKA, Futoshi NAGAOKA and Satoshi TANAKA

Department of Applied Physics, Faculty of Engineering, Hokkaido University, Sapporo, 060 Japan

(Received August 31, 1997; Accepted November 4, 1997)

An optical frequency-domain interferometer incorporating a Kösters prism is constructed to offer an excellent instrument for making a stable precision-measurement of material absorption and dispersion. The working stability is well retained over a long-term operation of 15 h, but the spectral resolution is limited to the resolving power of the spectrum analyzer used. The absorption and dispersion measurements are demonstrated by use of two samples of a BK-7 glass plate and rhodamine in ethanol.

Key words : frequency-domain interferometry, white-light source, Kösters prism, carrier frequency, long-term stability, absorption and dispersion measurements