[OPTICAL REVIEW Vol. 13, No. 4 (2006) 279-282]
© 2006 The Optical Society of Japan

Development of Scanning Near-Field Optical Microscope Working under Cryogenic Temperature and Strong Magnetic Field

Akihiro KIRIHARA, Shunsuke KONO, Akihisa TOMITA and Kazuo NAKAMURA1

Fundamental and Environmental Research Laboratories, NEC corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305-8501, Japan
1National Institute for Material Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan

(Received November 15, 2005; Accepted March 3, 2006)

We report on the development of a cantilever-based scanning near-field optical microscope (SNOM) working in an extreme environment, at cryogenic temperature around 10 K and under strong magnetic field up to 7 T. We designed a new optical system based on an infinite conjugate microscope, which extracts the near-field signal from a small aperture through a narrow chamber into free space as collimated light. Using this system, we successfully measured near-field and topographical images of a metal-hole sample simultaneously. Combining the local optical accessing technique with the external control of the electronic state, this SNOM system will be a powerful tool to study optical properties of semiconductor nanostructures.

Key words: SNOM, AFM, cantilever, magnetic field, quantum dot, quantum device