[OPTICAL REVIEW Vol. 14, No. 4 (2007) 194-200]
© 2007 The Optical Society of Japan

Measurement of Wavelength Dependence of Electro-Optic Coefficients r22 of Non-doped and 5% MgO-doped Congruent LiNbO3 Crystals and 1.8% MgO-doped Quasi-stoichiometric LiNbO3 Crystal by Multiple Reflection Interference Method

Kazuya YONEKURA, Lianhua JIN1, and Kuniharu TAKIZAWA1

Department of Applied Physics, Faculty of Engineering, Seikei University, Musashino, Tokyo 180-8633, Japan
1Department of Materials and Life Science, Faculty of Science and Technology, Seikei University, Musashino, Tokyo 180-8633, Japan

(Received February 13, 2007; Accepted May 28, 2007)

The electro-optic coefficient r22 in the wavelength range from 409 to 1580 nm was measured for non-doped and 5% MgO-doped congruent LiNbO3 crystals and 1.8% MgO-doped quasi-stoichiometric LiNbO3 crystals in a simple optical system using a multiple reflection interference method capable of producing high-precision results without the application of antireflection film to the end faces of the crystal. The influence of the manufacturing errors of the electro-optic crystals was discussed on the measurement of the r22 coefficient. The experimental errors are less than approximately 0.5% in the wavelength range from 409 to 1064 nm and approximately 1% from 1340 to 1580 nm. It was further shown that polarizing of the laser along X axis resulted in highly accurate measurement of the r22 of LiNbO3 crystals.

Key words: LiNbO3, electro-optic coefficient r22, dispersion, interference measurement, measurement error