[OPTICAL REVIEW Vol. 14, No. 6 (2007) 373-375]
© 2007 The Optical Society of Japan

Electro-Optic Coefficient Measurements for ZnxCd1-xTe Single Crystals at 1550 nm Wavelength

Yongseog JEON and Hyun Shik KANG1

Division of Electrical and Electronic Engineering, Jeonju University, Jeonju 560-759, Korea
1Department of Physics Education, Chonbuk National University, Jeonju 561-756, Korea

(Received January 31, 2007; Accepted June 29, 2007)

Nonlinear optical materials of the type ZnxCd1-xTe single crystals, where x=0.0, 0.2, 0.4, 0.6, 0.7, 0.8, and 1.0, have been grown by the Bridgman method, using a vertical furnace. We have investigated the electro-optic (E-O) coefficient and refractive index of ZnxCd1-xTe single crystals at optical communication wavelength (1550 nm). In the case of CdTe crystal, the E-O coefficient was 15.5× 10-12 m/V, which is the biggest among the E-O coefficients of ZnxCd1-xTe crystals. The E-O modulation signal was very big in low frequency range (DC–100 kHz), but the signal amplitude became smaller as we increased frequency above 100 kHz. We also found the acousto-optic modulation at CdTe single crystals.

Key words: electro-optic coefficient, THz generation, Pockels effect, acousto-optic modulator