Young-Chul SONG^* and Kil-Houm PARK

School of Electrical Engineering and Computer Science, Kyungpook National University, 1370 Sankyuk-dong, Puk-gu, Daegu 702-701, Korea

(Received July 2, 2010; Accepted December 10, 2010)

In this paper, we present the results of using a split Bregman method for blob-Mura defect detection in a thin-film transistor-liquid crystal display (TFT-LCD) image. A reference image obtained by the split Bregman method was simply subtracted from a test image to detect blob-Mura defects. For a test image, two resulting images containing black or white bob-Mura defects were obtained separately. Through simulation it was verified that the proposed method has a superior capability for detecting blob-Mura defects.

Key words: split Bregman method, TFT-LCD images, blob-Mura defect detection

^*E-mail address: songyc03@empal.com