Tae Won BEOM, Gi Chan PARK¹, Jin Woo LEE², Hun KIM¹, Hye Rim KIM¹, Seong Seon SHIN¹, and Jong Rak PARK^1*

DS Co., Ltd., Hwaseong, Gyeonggi 445-811, Korea ¹Department of Photonic Engineering, Chosun University, Gwangju 501-759, Korea ²IM Co., Ltd., Hwaseong, Gyeonggi 445-170, Korea

(Received July 27, 2011; Accepted March 26, 2012)

We have performed simulations of the ghost image phenomenon induced by a contrast enhancement film used for plasma display panels (PDPs). An optical imaging system was designed in order to investigate the ghost image qualitatively and quantitatively. We report on and discuss the effects of the material parameters and film orientation on the relative illuminance of the ghost image for a conventional louver-type contrast enhancement film adopting a trapezoidal black-stripe structure. The ghost image phenomenon is strongly affected by the film orientation relative to the PDP module and the difference between the refractive index of the ultraviolet curable urethane acrylate layer and that of the black stripes. We show that when the top side of the black stripes faces the PDP module and the refractive index difference is small, the ghost image phenomenon is weakened.

Key words: plasma display panel, contrast enhancement film, ghost image, illumination design

^*E-mail address: ejrpark@chosun.ac.kr