Alicia Fernández-OLIVERAS^*, Antonio M. POZO, and Manuel RUBIÑO

Departamento de Óptica, Facultad de Ciencias, Universidad de Granada Edificio Mecenas, Campus Fuentenueva, s/n. 18071 Granada, Spain

(Received July 13, 2012; Accepted November 29, 2012)

Charge-coupled device (CCD) and complementary metal-oxide semiconductor (CMOS) matrices offer excellent features in imaging systems. For assessing the suitability of each technology according to the application, the complete characterization of the detector arrays becomes necessary. A system is optically characterized by the modulation transfer function (MTF). We have comparatively studied the results provided by the speckle method for detectors of two types: CCD and CMOS. To do so, we first analysed the precision in determining the MTF of the CCD using two apertures at the exit port of an integrating sphere: a single and a double-slit. For the single-slit, we propose a new procedure of fitting the experimental data which overcomes the drawbacks of the conventional procedure. Since it offered lower uncertainty and better reproducibility, the single-slit was used for the study with the CMOS detector. Significant differences were found between the MTF of the CCD and the CMOS detectors.

Key words: detector arrays, charge-coupled devices (CCD), complementary metal-oxide semiconductor (CMOS), speckle pattern, modulation transfer function (MTF), uncertainty, repeatability, reproducibility

^*E-mail address: alilia@ugr.es