[OPTICAL REVIEW Vol. 20, No. 5 (2013) 426-432]
© 2013 The Japan Society of Applied Physics

Guided Wave Measurements for Characterization of Sol–Gel Layers

Hervé PIOMBINI1, Xavier DIEUDONNE1, Thomas WOOD2, and François FLORY2

1Commissariat à l'Energie Atomique, DAM LE RIPAULT, F-37260 Monts, France
2IM2NP, Faculté des Sciences et Techniques, Avenue Escadrille Normandie Niémen, 13397 Marseille Cedex 20, France

(Received May 15, 2013; Accepted June 19, 2013)

Sol–gel applications require very thick layers with a good understanding of the interfaces. To address this problem, we have installed at CEA Le Ripault a characterization bench using guided waves with assistance from the IM2NP lab in Marseille. This bench allows us to measure the thickness and the refractive index and determine the extinction coefficient of a thin layer. We can distinguish losses at interfaces from those in the bulk according to the chosen propagation mode. This allows us to know if we can stack elementary layers to make thick layers without incurring problems.

Key words: m-line, sol–gel, refractive index, extinction coefficient