ƒvƒ‰ƒYƒ}ƒGƒŒƒNƒgƒƒjƒNƒXÜ (Plasma Electronics Award)@ŽóÜŽÒ‚ÌЉîi2003”N`j
‘æ22‰ñi2023”N“xj
˜_•¶m1n
ŽóÜŽÒ‹v•ÛˆäMsA¼’JONA’C–¤“N–çA¬—ѳŽ¡A”‹–{Œ«ÆAŠâŒ³—Eliƒ\ƒj[ƒZƒ~ƒRƒ“ƒ_ƒNƒ^ƒ\ƒŠƒ…[ƒVƒ‡ƒ“ƒYj ˜_•¶–¼Modeling and simulation of coverage and film properties in deposition process on large-scale pattern using statistical ensemble method ŽGŽ–¼Jpn. J. Appl. Phys. 62, Sl1006 (2023). ’˜ŽÒ–¼Nobuyuki Kuboi, Hiroyasu Matsugai, Tetsuya Tatsumi, Shoji Kobayashi, Yoshiya Hagimoto, and Hayato Iwamoto ˜_•¶m2n
ŽóÜŽÒ“à“c‹Vˆê˜Yi–¼é‘åjA‰v–{K‘×i–¼é‘åjA匴Š²li–¼é‘åjA’rç³—R”üŽqi–¼é‘åjA¬–ìWŽŸ˜Yi‹ãB‘åjAŒÃŠÕˆêŒ›i‹ãB‘åjA¬àV—²Oi‘åã‘åj ˜_•¶–¼Single-step fabrication of fibrous Si/Sn composite nanowire anodes by high-pressure He plasma sputtering for high-capacity Li-ion batteries ŽGŽ–¼Sci. Rep. 13, 14280 (2023). ’˜ŽÒ–¼Giichiro Uchida, Kodai Masumoto, Mikito Sakakibara, Yumiko Ikebe, Shinjiro Ono, Kazunori Koga, Takahiro Kozawa
‘æ21‰ñi2022”N“xj
˜_•¶m1n
ŽóÜŽÒ¬’rŒ’A@‰ª‹ÏAŽ›“ˆ˜a•vAˆÉ“¡„mi“Œ‹ž‘åŠwj ˜_•¶–¼Electric-Field-Induced Coherent Anti-Stokes Raman Scattering of Hydrogen Molecules in Visible Region for Sensitive Field Measurement ŽGŽ–¼Physical Review Letters 129, 033202 (2022). ’˜ŽÒ–¼Takeru Koike, Hitoshi Muneoka, Kazuo Terashima, and Tsuyohito Ito ˜_•¶m2n
ŽóÜŽÒŽsìŒi‘¾i–¼ŒÃ‰®‘åŠwjCManh Hung Chui“ú–{ƒGƒAƒŠƒL[ƒhjCXŽR½iƒLƒIƒNƒVƒAjC—é–Ø—zi–¼ŒÃ‰®‘åŠwjC”Ñ–ì‘å‹PiƒLƒIƒNƒVƒAjC•Ÿ…—T”ViƒLƒIƒNƒVƒAjCŒIŒ´ˆê²iƒLƒIƒNƒVƒAjC–L“c_Fi–¼ŒÃ‰®‘åŠwj ˜_•¶–¼Angular Distribution Measurement of High-Energy Argon Neutral and Ion in A 13.56 MHz Capacitively-Coupled Plasma ŽGŽ–¼Applied Physics Express 14, 126001 (2021). ’˜ŽÒ–¼Keita Ichikawa, Manh Hung Chu, Makoto Moriyama, Naoya Nakahara, Haruka Suzuki, Daiki Iino, Hiroyuki Fukumizu, Kazuaki Kurihara, and Hirotaka Toyoda
‘æ20‰ñi2021”N“xj
˜_•¶m1n
ŽóÜŽÒ‘å¼ LiƒŒ[ƒU[ƒeƒbƒNŠ”Ž®‰ïŽÐjAŽRè •¶“¿iŽO•H“d‹@Š”Ž®‰ïŽÐjA ” è Šì˜Yi“ŒŽÅƒGƒlƒ‹ƒM[ƒVƒXƒeƒ€Š”Ž®‰ïŽÐjA ’|‘º «¹Ž÷Aª’à “ÄAÔ’Ë —mi“Œ‹žH‹Æ‘åŠwj ˜_•¶–¼Measurement of electron temperature and density of atmospheric-pressure non-equilibrium argon plasma examined with optical emission spectroscopy ŽGŽ–¼Japanese Journal of Applied Physics 60, 026002 (2021) ’˜ŽÒ–¼Hiroshi Onishi, Fuminori Yamazaki, Yoshiro Hakozaki, Masaki Takemura, Atsushi Nezu, and Hiroshi Akatsuka ˜_•¶m2n
ŽóÜŽÒ²X–Ø Â‘¾A‚“‡ Œ\‰îA‹àŽq r˜Yi“Œ–k‘åŠwj ˜_•¶–¼Portable Plasma Device for Electric N2O5 Production from Air ŽGŽ–¼Industrial & Engineering Chemistry Research 60, 798-801 (2021) ’˜ŽÒ–¼Shota Sasaki, Keisuke Takashima, and Toshiro Kaneko
‘æ19‰ñi2020”N“xj
˜_•¶m1n
ŽóÜŽÒ‹à Ú_A”Š_ G’mAå“c ‘niŽY‹Æ‹Zp‘‡Œ¤‹†Šj ˜_•¶–¼Low-Temperature Graphene Growth by Forced Convection of Plasma-Excited Radicals ŽGŽ–¼Nano Letters 19, 739 (2019) ’˜ŽÒ–¼Jaeho Kim, Hajime Sakakita, and Hiromoto Itagaki ˜_•¶m2n
ŽóÜŽÒ²“¡ DOAŽÄ“c ‘iƒpƒiƒ\ƒjƒbƒNŠ”Ž®‰ïŽÐjAè•” Œpˆê˜YA]—˜Œû _“ñi‹ž“s‘åŠwj ˜_•¶–¼Evaluation of residual defects created by plasma exposure of Si substrates using vertical and lateral pn junctions ŽGŽ–¼Journal of Vacuum Science and Technology B38, 012205 (2020) ’˜ŽÒ–¼Yoshihiro Sato, Satoshi Shibata, Keiichiro Urabe, and Koji Eriguchi
‘æ18‰ñi2019”N“xj
˜_•¶m1n
ŽóÜŽÒ‹v•ÛˆäMsiƒ\ƒj[ƒZƒ~ƒRƒ“ƒ_ƒNƒ^ƒ\ƒŠƒ…[ƒVƒ‡ƒ“ƒYŠ”Ž®‰ïŽÐjA’C–¤“N–çiƒ\ƒj[ƒZƒ~ƒRƒ“ƒ_ƒNƒ^ƒ\ƒŠƒ…[ƒVƒ‡ƒ“ƒYŠ”Ž®‰ïŽÐjA¬’¬ AŽRì^–íiƒ\ƒj[ƒZƒ~ƒRƒ“ƒ_ƒNƒ^ƒ\ƒŠƒ…[ƒVƒ‡ƒ“ƒYŠ”Ž®‰ïŽÐj ˜_•¶–¼Insights into different etching properties of continuous wave and atomic layer etching processes for SiO2 and Si3N4 films using voxel-slab mode ŽGŽ–¼Journal of Vacuum Science & Technology A 37, 051004 (2019) ’˜ŽÒ–¼Nobuyuki Kuboi, Tetsuya Tatsumi, Jun Komachi, and Shinya Yamakawa ˜_•¶m2n
Žó܎ґ呺ŒõLiƒLƒIƒNƒVƒAŠ”Ž®‰ïŽÐjA‹´–{“ÕˆêiƒLƒIƒNƒVƒAŠ”Ž®‰ïŽÐjA‘«—§V‘ñiƒLƒIƒNƒVƒAŠ”Ž®‰ïŽÐjA‹ß“¡—S‰îiƒLƒIƒNƒVƒAŠ”Ž®‰ïŽÐjAÎ쟘NiƒLƒIƒNƒVƒAŠ”Ž®‰ïŽÐjAˆ¢•”~ŽqiƒLƒIƒNƒVƒAŠ”Ž®‰ïŽÐjAŽðˆäˆÉ“sŽqiƒLƒIƒNƒVƒAŠ”Ž®‰ïŽÐjA—Ñ ‹v‹MiƒLƒIƒNƒVƒAŠ”Ž®‰ïŽÐjAŠÖª ½i–¼ŒÃ‰®‘åŠwjA–x Ÿi–¼ŒÃ‰®‘åŠwj ˜_•¶–¼Formation mechanism of sidewall striation in high-aspect-ratio hole etching ŽGŽ–¼Japanese Journal of Applied Physics 58, SEEB02 (2019) ’˜ŽÒ–¼itsuhiro Omura, Junichi Hashimoto, Takahiro Adachi, Yusuke Kondo, Masao Ishikawa, Junko Abe, Itsuko Sakai, Hisataka Hayashi, Makoto Sekine, and Masaru Hori
‘æ17‰ñi2018”N“xj
˜_•¶m1n
ŽóÜŽÒ•z‘º ³‘¾iŽY‹Æ‹Zp‘‡Œ¤‹†ŠjAâ“c Œ÷iŽY‹Æ‹Zp‘‡Œ¤‹†ŠjA¼Œ´ _ŽiiŽY‹Æ‹Zp‘‡Œ¤‹†Šj ˜_•¶–¼Plasma-Induced Electronic Defects: Generation and Annihilation Kinetics in Hydrogenated Amorphous Silicon ŽGŽ–¼Physical Review Applied, 10, 054006 (2018) ’˜ŽÒ–¼Shota Nunomura, Isao Sakata, and Koji Matsubara ˜_•¶m2n
Žó܎ґ呺 ŒõLi“ŒŽÅƒƒ‚ƒŠ(Š”)jAŒÃ–{ ˆêmi“ŒŽÅƒƒ‚ƒŠ(Š”)jA¼“c ˜a‹vi“ŒŽÅƒƒ‚ƒŠ(Š”)jA²X–Ø rsi“ŒŽÅƒƒ‚ƒŠ(Š”)jAŽðˆä ˆÉ“sŽqi“ŒŽÅƒƒ‚ƒŠ(Š”)jA—Ñ ‹v‹Mi“ŒŽÅƒƒ‚ƒŠ(Š”)j ˜_•¶–¼Layer-by-layer etching of LaAlSiOx ŽGŽ–¼Plasma Sources Science and Technology, 26, 065015 (2017) ’˜ŽÒ–¼Mitsuhiro Omura, Kazuhito Furumoto, Kazuhisa Matsuda, Toshiyuki Sasaki, Itsuko Sakai and Hisataka Hayashi
‘æ16‰ñi2017”N“xj
˜_•¶m1n
ŽóÜŽÒ¼ŽR C•ãi–kŠC“¹‘åŠwjA’†–ì Ž¡‹viŠj—Z‡‰ÈŠwŒ¤‹†ŠjAŒã“¡ ŠîŽuiŠj—Z‡‰ÈŠwŒ¤‹†ŠjA²X–Ø _ˆêi–kŠC“¹‘åŠwj ˜_•¶–¼Stark spectroscopy at Balmer-ƒ¿ line of atomic hydrogen for measuring sheath electric field in a hydrogen plasma ŽGŽ–¼Journal of Physics D: Applied Physics, 50, 234003 (2017) ’˜ŽÒ–¼Shusuke Nishiyama, Haruhisa Nakano, Motoshi Goto, and Koichi Sasaki ˜_•¶m2n
ŽóÜŽÒ•x“c Œ’‘¾˜Yi‹ãB‘åŠwjA²“¡ —S‘¾i‹ãB‘åŠwjA’zŽR »ˆêi‹ãB‘åŠwjA]Œû Žõ–¾i‹ãB‘åŠwjA“à–ì Šìˆê˜Yi‹ãB‘åŠwjA_‰Æ Kˆê˜YiƒMƒKƒtƒHƒgƒ“Š”Ž®‰ïŽÐjAŒËŽº Œ[–¾iƒMƒKƒtƒHƒgƒ“Š”Ž®‰ïŽÐjAaŒû ŒviƒMƒKƒtƒHƒgƒ“Š”Ž®‰ïŽÐjA»Œ´ ~iPurdue ‘åŠwjA¼Œ´ Œ÷Ci‘åã‘åŠwj ˜_•¶–¼Time-resolved two-dimensional profiles of electron density and temperature of laser-produced tin plasmas for extreme-ultraviolet lithography light sources ŽGŽ–¼Scientific Reports, 7, 12328 (2017) ’˜ŽÒ–¼Kentaro Tomita, Yuta Sato, Syouichi Tsukiyama, Toshiaki Eguchi, Kiichiro Uchino, Kouichiro Kouge, Hiroaki Tomuro, Tatsuya Yanagida, Yasunori Wada, Masahito Kunishima, Georg Soumagne, Takeshi Kodama, Hakaru Mizoguchi, Atsushi Sunahara, and Katsunobu Nishihara
‘æ15‰ñi2016”N“xj
˜_•¶m1n
ŽóÜŽÒ™Z‹Ê ’¼li‹à‘ò‘åŠwjA“c’† N‹Ki‹à‘ò‘åŠwjA–k Œ’‘¾˜Yi’†•”“d—ÍjAã™ Šì•Fi‹à‘ò‘åŠwjAΓ‡ ’B•vi‹à‘ò‘åŠwjA“nç² Žüi“ú´»•²ƒOƒ‹[ƒv–{ŽÐjA’†‘º Œ\‘¾˜Yi“ú´»•²ƒOƒ‹[ƒv–{ŽÐj ˜_•¶–¼A method for large-scale synthesis of Al-doped TiO2 nanopowder using pulse-modulated induction thermal plasmas with time-controlled feedstock feeding ŽGŽ–¼Journal of Physics D: Appl. Phys., 47,195304 (2014) ’˜ŽÒ–¼Naoto Kodama, Yasunori Tanaka,Kentaro Kita, Yoshihiko Uesugi,Tatsuo Ishijima, Shu Watanabe and Keitaro Nakamura ˜_•¶m2n
ŽóÜŽÒ²X–Ø Â‘¾i“Œ–k‘åŠwjA_è “Wi“Œ–k‘åŠwjA‹àŽq r˜Yi“Œ–k‘åŠwj ˜_•¶–¼Calcium influx through TRP channels induced by short-lived reactive species in plasma-irradiated solution ŽGŽ–¼Scientific Reports, 6, 25728 (2016) ’˜ŽÒ–¼Shota Sasaki, Makoto Kanzaki and Toshiro Kaneko ‘æ14‰ñi2015”N“xj
˜_•¶m1n
Žó܎ҔŠ_ “Þ•ä (‹ãB‘åŠw)A¼“‡ Gˆê (‹ãB‘åŠw)AŽR‰º ‘å•ã (‹ãB‘åŠw)A™ çé—Y (‹ãB‘åŠw)AŒÃŠÕ ˆêŒ› (‹ãB‘åŠw)A”’’J ³Ž¡ (‹ãB‘åŠw) ˜_•¶–¼Synthesis and Characterization of ZnInON Semiconductor: a ZnO-based Compound with Tunable Band Gap ŽGŽ–¼Materials Research Express 1, 036405 (2014) ’˜ŽÒ–¼Naho Itagaki, Koichi Matsushima, Daisuke Yamashita, Hyunwoong Seo, Kazunori Koga, and Masaharu Shiratani ˜_•¶m2n
ŽóÜŽÒ‹T“‡ îŒá (“Œ‹žH‹Æ‘åŠw)A“c‘º šõŽu˜N (“Œ‹žH‹Æ‘åŠw)A΋´ —T‘¾˜Yi“ú´»•²(Š”)jA–ìè ’q—m (“Œ‹žH‹Æ‘åŠw) ˜_•¶–¼Pulsed dry methane reforming in plasma-enhanced catalytic reaction ŽGŽ–¼Catalysis Today, 256, 67 (2015) ’˜ŽÒ–¼Seigo Kameshima, Keishiro Tamura, Yutaro Ishibashi, and Tomohiro Nozaki
‘æ13‰ñi2014”N“xj
˜_•¶m1n
ŽóÜŽÒ–{ŠÔ Œ[ˆê˜Yi–{“c‹ZŒ¤H‹ÆjC_Œ´ ~i“Œ‹ž‘åŠwj ˜_•¶–¼High throughput production of nanocomposite SiO2 powders by plasma spray physical vapor deposition for negative electrode of lithium ion batteries ŽGŽ–¼Sci. Technol. Adv. Mater., 15, 025006 (2014) ’˜ŽÒ–¼Keiichiro Homma, Makoto Kambara and Toyonobu Yoshida ˜_•¶m2n
ŽóÜŽÒ‹v•Ûˆä Msiƒ\ƒj[iŠ”jjC’C–¤ “N–çiƒ\ƒj[iŠ”jjC[‘ò ³‰iiƒ\ƒj[iŠ”jjC–؉º —²iƒ\ƒj[iŠ”jjC¬’¬ iƒ\ƒj[iŠ”jjCˆÀâV ‹v_iƒ\ƒj[iŠ”jj ˜_•¶–¼Effect of open area ratio and pattern structure on fluctuations in critical dimension and Si recess ŽGŽ–¼J. Vac. Sci. Technol., A31, 061304 (2013) ’˜ŽÒ–¼Nobuyuki Kuboi, Tetsuya Tatsumi, Masanaga Fukasawa, Takashi Kinoshita, Jun Komachi, Hisahiro Ansai and Hiroyuki Miwa
‘æ12‰ñi2013”N“xj
˜_•¶m1n
ŽóÜŽÒ‰Á“¡rŒ°i“Œ–k‘åŠwjC”©ŽR—ÍŽOi“Œ–k‘åŠwj ˜_•¶–¼Site- and alignment-controlled growth of graphene nanoribbons from nickel nanobars ŽGŽ–¼Nature Nanotechnol. 7, 651 (2012) ’˜ŽÒ–¼T. Kato and R. Hatakeyama ˜_•¶m2n
ŽóÜŽÒ‹v•ÛˆäMsiƒ\ƒj[iŠ”jjC’C–¤“N–çiƒ\ƒj[iŠ”jjC¬—ѳŽ¡iƒ\ƒj[iŠ”jjC–؉º—²iƒ\ƒj[iŠ”jjC¬’¬iƒ\ƒj[iŠ”jjC[‘ò³‰iiƒ\ƒj[iŠ”jjCˆÀÖ‹v_iƒ\ƒj[iŠ”jj ˜_•¶–¼Modeling and simulation of plasmainduced damage distribution during hole etching of SiO2 over Si substrate by fluorocarbon plasma ŽGŽ–¼Appl. Phys. Express, 5, 126201 (2012) ’˜ŽÒ–¼N. Kuboi, T. Tatsumi, S. Kobayashi, T. Kinoshita, J. Komachi, M. Fukasawa and H. Ansai
‘æ11‰ñi2012”N“xj
˜_•¶m1n
ŽóÜŽÒÎì Œ’Ž¡(–¼ŒÃ‰®‘åŠw)C˜hŒ©’¼–ç(“Œ–MƒKƒX)C‰Í–ì º•F(‹à‘òH‹Æ‘åŠw)C–xç² ‰p•v(‹à‘òH‹Æ‘åŠw)C’|“c Œ\Œá(–¼ŒÃ‰®‘åŠw)C‹ß“¡ ”ŽŠî(–¼ŒÃ‰®‘åŠw)CŠÖª ½(–¼ŒÃ‰®‘åŠw)C–x Ÿ(–¼ŒÃ‰®‘åŠw) ˜_•¶–¼Synergistic Formation of Radicals by Irradiation with both Vacuum Ultraviolet and Atomic Hydrogen: a Real-time in situ Electron Spin Resonance Study ŽGŽ–¼J. Phys. Chem. Lett. 2, 1278-1281 (2011) ’˜ŽÒ–¼Kenji Ishikawa, Naoya Sumi, Akihiko Kono, Hideo Horibe, Keigo Takeda, Hiroki Kondo, Makoto Sekine, and Masaru Hori ˜_•¶m2n
Žó܎҈ɓ¡ ’qŽq(‘åã‘åŠw)C“‚‹´ ˆê_(‘åã‘åŠw)C[‘ò ³‰i(ƒ\ƒj[(Š”))C’C–¤ “N–ç(ƒ\ƒj[(Š”))C•lŒû ’qŽu(‘åã‘åŠw) ˜_•¶–¼Si Recess of Polycrystalline Silicon Gate Etching: Damage Enhanced by Ion Assisted Oxygen Diffusion ŽGŽ–¼Jpn. J. Appl. Phys. 50, 08KD02 (5pp) (2011) ’˜ŽÒ–¼Tomoko Ito, Kazuhiro Karahashi, Masanaga Fukasawa, Tetsuya Tatsumi, and Satoshi Hamaguchi
‘æ10‰ñi2011”N“xj
˜_•¶ ŽóÜŽÒæâ@‰n i‰Í“ì”_‹Æ‘åŠwA’†‘jC‰¬–ì@–¾‹v iɪ‘åŠwjC‰i’Ã@‰ëÍ iɪ‘åŠwj ˜_•¶–¼Effects of N2-O2 Gas Mixture Ratio on Microorganism Inactivation in Low-@Pressure Surface Wave Plasma ŽGŽ–¼Japanese Journal of Applied Physics 50 (2011) 08JF05 ’˜ŽÒ–¼Ying Zhao, Akihisa Ogino, and Masaaki Nagatsu
‘æ‚X‰ñi2010”N“xj
˜_•¶m1n
ŽóÜŽÒ’‡‘ºŒb‰EiŽO•H“d‹@jCà_“c‘å•ã(P&GƒWƒƒƒpƒ“)Cã“c‹`–@(ìèdH)C]—˜Œû_“ñi‹ž“s‘åŠwjC•€‚ˆêi‹ž“s‘åŠwj ˜_•¶–¼Selective Etching of High-k Dielectric HfO2 Films over Si in BCl3-Containing Plasmas without rf Biasing ŽGŽ–¼Applied Physics Express 2, 016503 (2009) ’˜ŽÒ–¼K. Nakamura, D. Hamada, Y. Ueda, K. Eriguchi and K. Ono ˜_•¶m2n
ŽóÜŽÒ“à“c‹Vˆê˜Yi‹ãB‘åŠwjC“à“c—@iŽñ“s‘åŠw“Œ‹žjCHŽR—˜KiŽŸ¢‘ãPDPŠJ”ƒZƒ“ƒ^[jC
ŠŽR”ŽŽiiL“‡‘åŠwjCŽÂ“c™B(L“‡‘åŠw) ˜_•¶–¼Effect of high Xe-concentration in a plasma display panel with a SrCaO cold cathode ŽGŽ–¼Journal of Applied Physics 107, 103311 (2010) ’˜ŽÒ–¼G. Uchida, S. Uchida, T. Akiyama, H. Kajiyama and T. Shinoda
‘æ‚W‰ñi2009”N“xj
˜_•¶ ŽóÜŽÒw“à˜ÅèÁi“Œ–k‘åŠwjCÜ“c•qKiOKIƒZƒ~ƒRƒ“ƒ_ƒNƒ^‹{éjC‹´–{i“Œ‹žƒGƒŒƒNƒgƒƒ“‹ZpŒ¤‹†ŠjC
Žs‹´—R¬iŽO—m“d‹@jC‘å’|_li“Œ–k‘åŠwjCŠ¦ì½“ñi“Œ–k‘åŠwj ˜_•¶–¼On-wafer monitoring of charge accumulation and sidewall conductivity in high-aspect-ratio contact holes during SiO2 etching process ŽGŽ–¼Journal of Vacuum Science and Technology, Vol. B25, No. 6, (2007) pp. 1808-1813 ’˜ŽÒ–¼B. Jinnai, T. Orita, M. Konishi, J. Hashimoto, Y. Ichihashi, A. Nishitani, S. Kadomura,, H. Ohtake, S. Samukawa
‘æ‚V‰ñi2008”N“xj
˜_•¶m1n
ŽóÜŽÒ”©ŽR—ÍŽO(“Œ–k‘åŠw)C‹àŽqr˜Y(“Œ–k‘åŠw)C—›‰i•ô(“Œ–k‘åŠw)C‰Á“¡rŒ°(“Œ–k‘åŠw)C”nê˜a•F(“Œ–k‘åŠw)C‰ª“cŒ’(“Œ–k‘åŠw) ˜_•¶–¼Single-stranded DNA insertion into single-walled carbon nanotube by ion irradiation in an electrolyte plasma ŽGŽ–¼Japanese Journal of Applied Physics, 45 (2006) 8335-8339. ’˜ŽÒ–¼T. Okada, T. Kaneko, R. Hatakeyama ˜_•¶m2n
˜_•¶–¼Novel-structured carbon nanotubes creation by nanoscopic plasma control ŽGŽ–¼Plasma Sources Science and Technology 17 (2008) 024009 (11 pages) ’˜ŽÒ–¼R. Hatakeyama, T. Kaneko, W. Oohara, Y. F. Li, T. Kato, K. Baba, J. Shishido ‘æ‚U‰ñi2007”N“xj
˜_•¶ ŽóÜŽÒŽ›“ˆ˜a•v(“Œ‹ž‘åŠw)C☋‚–¾(“Œ‹ž‘åŠw)C•Ð•½Œ¤(“Œ‹ž‘åŠw)C‹v•ÛGä(“Œ‹ž‘åŠw)C´…’õŽ÷(ŽY‹Æ‹Zp‘‡Œ¤‹†Š)C²X–Ø‹B(ŽY‹Æ‹Zp‘‡Œ¤‹†Š)C‰zè’¼l(ŽY‹Æ‹Zp‘‡Œ¤‹†Š) ˜_•¶–¼Carbon materials syntheses using dielectric barrier discharge microplasma in supercritical carbon dioxide environments ŽGŽ–¼The Journal of Supercritical Fluids 41 (2007) 404-411. ’˜ŽÒ–¼Takaaki Tomai, Ken Katahira, Hirotake Kubo, Yoshiki Shimizu, Takeshi Sasaki, Naoto Koshizaki, Kazuo Terashima ‘æ‚T‰ñi2006”N“xj
˜_•¶ ŽóÜŽÒ@‹{‹Åi–¼ŒÃ‰®‘åŠwj, –L“c_Fi–¼ŒÃ‰®‘åŠwj, –x“c–F•Fi–¼ŒÃ‰®‘åŠwj, ›ˆäG˜Yi–¼ŒÃ‰®‘åŠw, Œ»@’†•”‘åŠwj ˜_•¶–¼Suppression of oxygen impurity incorporation into silicon films prepared from surface-wave excited H2/SiH4 plasma ŽGŽ–¼Japanese Journal of Applied Physics, 43 (2004) 7696-7700. ’˜ŽÒ–¼S. Somiya, H. Toyoda, Y. Hotta, H. Sugai ‘æ‚S‰ñi2005”N“xj
˜_•¶ ŽóÜŽÒŽðˆä@“¹i‹ž“s‘åŠwjCâŒû‘ñ¶i‹ž“s‘åŠwjCˆÉ“¡—z‰îi‹ž“s‘åŠwjC‹k@–M‰pi‹ž“s‘åŠwj ˜_•¶–¼Interaction and control of millimeter-waves with microplasma arrays ŽGŽ–¼Plasma Physics and Controlled Fusion, Vol. 47 (2005) B617-B627. ’˜ŽÒ–¼O.Sakai, T. Sakaguchi, Y. Ito and K. Tachibana ‘æ‚R‰ñi2004”N“xj
˜_•¶m1n
Žó܎ҌÊՈꌛi‹ãB‘åŠwjCb”㊲‰piŽO—m“d‹@jC”’’J³Ž¡i‹ãB‘åŠwjC“n•Óª•vi‹ãB‘åŠwjCŽ’J¸i•Ÿ‰ªH‹Æ‘åŠwj ˜_•¶–¼Cluster-suppressed plasma chemical vapor deposition metbod for high quality hydrogenated amorphous silicon films ŽGŽ–¼Japanese Journal of Applied Physics, Vol. 41(2002) pp.L168-L170 (Express Letters) ’˜ŽÒ–¼Kazunori Koga, Motohide Kai, Masaharu Shiratani, Yukio Watanabe (Kyushu University); Noboru Shikatani (Fukuoka Institute of Technology) ˜_•¶m2n
ŽóÜŽÒ”ª–ØàV‘ìiŒcœä‹`m‘åŠwjC‘Od˜aLiˆ®ÉŽqjC“‡“c‘ìiŒcœä‹`m‘åŠwjC^•Ç—˜–¾iŒcœä‹`m‘åŠwj ˜_•¶–¼Prediction of radial variation of plasma structure and ion distribution in the wafer interface in two-frequency capacitively coupled plasma ŽGŽ–¼IEEE Transaction on Plasma Science Vo1. 32(2004) pp.90-100 (Invited Review Paper) ’˜ŽÒ–¼Takashi Yagisawa, Kazunobu Maeshige,Takashi Shimada and Toshiaki Makabe (Keio University) ‘æ‚Q‰ñi2003”N“xj
˜_•¶m1n
ŽóÜŽÒŽR“c_•¶i“Œ—m‘åŠwjC‰ª–{K—Yi“Œ—m‘åŠwj ˜_•¶–¼Characteristics of a high-power microwave-induced helium plasma at atmospheric pressure for the determination of nonmetals in aqueous solution ŽGŽ–¼Applied Spectroscopy, Vol. 55, No. 2, pp. 114-119 (2001) ’˜ŽÒ–¼Hirofumi Yamada and Yukio Okamoto (Toyo University) ˜_•¶m2n
ŽóÜŽÒ¬¼³“ñ˜Yi•¨Ž¿Œ¤‹†ŠjD‘q“ˆŒhŽŸi•¨Ž¿Œ¤‹†ŠjD‰ª“cŸsi•¨Ž¿Œ¤‹†ŠjDŽO—FŒìi•¨Ž¿Œ¤‹†ŠjDŽç‹g—C‰îi–@‘åŠwjD´…’õŽ÷iŽY‹Æ‹Zp‘‡Œ¤‹†ŠjD”’’J³Ž¡i‹ãB‘åŠwjD’†–ìrŽ÷i–h‰q‘åŠwjDŠ¦ì½“ñi“Œ–k‘åŠwj ˜_•¶–¼Highly crystalline 5H-polytype of sp3-bonded boron nitride prepared by plasma-packets-assisted pulsed-laser depositon: An ultraviolet light emitter at 225 nm ŽGŽ–¼Applied Physics Letters, Vol. 81, No. 24, pp. 4547-4549 (2002) ’˜ŽÒ–¼Shojiro Komatsu, Keiji Kurashima, Hisao Kanda, Katsuyuki Okada, and Mamoru Mitomo (National Institute for Material Science); Yusuke Moriyoshi (Hosei University); Yoshiki Shimizu (National Institute of Advanced Industrial Science and Technology); Masaharu Shiratani (Kyushu University); Toshiki Nakano(National Defense Academy); Seiji Samukawa (Tohoku University) ‘æ‚P‰ñi2002”N“xj
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