[OPTICAL REVIEW Vol. 3, No. 4 (1996) 238-242]

Brewster Anomalies in Opaque Random Amorphous Multilayers a-Si:H/ a-Si3N4+x:H

Shigeki TAKEUCHI,1,2 Shoji NITTA,1 Yukihiro YAMADA1,* and Shuichi NONOMURA1

1Department of Electronic and Computer Engineering, Gifu University, 1-1, Yanaido, Gifu, 501-11 Japan, 2Scientific Investigation Research Laboratory, Gifu Prefecture, 2-1-1, Yabutaminami, Gifu, 500 Japan

(Received November 25, 1994; Accepted April 30, 1996)

Reflectance anomalies of random amorphous multilayers are shown to be different dependence on the incident angle for s- and p-polarized light by simulation. Disappearance of these anomalies has especially been observed for p-polarized light propagation at a certain incident angle. It is shown that this incident angle is the extended Brewster angle defined for opaque materials. This phenomenon, i.e., the disappearance of reflectance anomalies, is the Brewster anomaly in random amorphous multilayers made with absorbent materials. Preliminary results of experiments are also presented.

Key words : random amorphous multilayer, polarization, Brewster angle, absorption, reflectance, one-dimensional random structure, multiple scattering, interference, localization of light

*Present address: Oki Electric Industry Co., Ltd., Shin Toranomon Bilding, 1-7-12 Toranomon, Minato-ku, Tokyo, 105 Japan

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