IWDTF 2019

2019 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES(次世代電子デバイスのための誘電体薄膜-科学と技術-2019)

日時

2019年11月18日(月)~20日(水)

場所

東京工業大学 大岡山キャンパス

ホームページ

http://iwdtf.org/

参加申し込み方法

会議ホームページの参加申込フォームからお申込み下さい↓
参加登録ページへのリンク

SCOPE

· Electron device application of dielectric thin films
· Material design of dielectric thin films
· Growth and related process of dielectric thin films
· Characterization and control of dielectrics, dielectrics surfaces, and dielectrics interfaces
· Electrical characterization of dielectrics, dielectrics surfaces, and dielectrics interfaces
· Surface preparation and cleaning issues for dielectrics
· Dielectric wearout and reliability
· Dielectric reliability related to process integration
· Surface passivation technology
· Theoretical approaches to dielectrics, dielectrics surfaces, and dielectrics interfaces

KEYNOTE SPEAKER

Ernest Wu (IBM): “Facts and Myths of Dielectric Breakdown Processes”
Shinichi Takagi (Univ. Tokyo): “Importance of semiconductor MOS interface control on advanced electron devices”

INVITED SPEAKER

Yi Zhao (Zhejiang Univ.): “Ge-based Non-Volatile Memories”
Tuo-Hung Hou (National Chiao Tung Univ.): “Emerging memory for data-centric computing”
Tadashi Yamaguchi (Renesas Electronics): “Highly Reliable Ferroelectric Hf0.5Zr0.5O2 Film with Al Nanoclusters Embedded by Sub-Monolayer Doping Technique”
Kohsuke Nagashio (Univ. Tokyo): “Understanding interface properties in 2D heterostructure FETs”
Hiroshi Yano (Univ. Tsukuba): “SiC MOS interface: what limits the channel mobility? ”
Daigo Kikuta (Toyota Central R&D Labs.):”Improvement of gate oxide reliability and instability in GaN-based MOS devices”

TOPICAL SESSION

“Achievement in Understanding Oxidation Processes of Si, Ge, SiGe, SiC, and GaN – 20 Years Anniversary –”
Yuji Takakuwa (Tohoku Univ.), Takayoshi Shimura (Osaka Univ.), Tomonori Nishimura (Univ. Tokyo), Takuji Hosoi (Osaka Univ.), Yoshihiro Irokawa (NIMS)

問合せ

IWDTF 2019 事務局 〒158-0082 東京都世田谷区等々力8-15-1 東京都市大学総合研究所
Tel:03-5706-3691  Fax:03-5706-3125  E-mail: iwdtf2019@ssl.ee.tcu.ac.jp

更新:2019/9/23